少子寿命,Minority carrier lifetime英语短句,例句大全

少子寿命,Minority carrier lifetime
1)Minority carrier lifetime少子寿命
1.The minority carrier lifetime(τ) scan mapping along the multicrystalline ingot was obtained by means of Microwave Photo Conductive Decay (μ-PCD).应用微波光电导衰减仪(μ-PCD)测得了铸造多晶硅硅锭沿生长方向少子寿命的分布图。
2.All these three ways can improve the minority carrier lifetime effectively.三种吸杂方式都能明显提高多晶硅的少子寿命。
3.The effects of surface thermal oxidation on the minority carrier lifetime of Czochralski (CZ) silicon wafers are investigated by photoconductive decay (PCD) method.用高频光电导衰减法 (PCD)研究了热氧化钝化对直拉硅少子寿命的影响。

英文短句/例句

1.Analysis and Research of Measuring Minority-Carrier Lifetime in Diode and Silicon Material of Bonding;硅键合材料及二极管少子寿命测试分析与研究
2.EFFECT OF TRANSITION-METAL CONTAMINATION ON MINORITY LIFETIME IN CAST MULTI-CRYSTALLINE SILICON UNDER RAPID THERMAL PROCESSING快速热处理工艺下金属杂质对铸造多晶硅少子寿命的影响
3.Minority Carrier Lifetime of Silicon Solar Cell Research and Measurement;硅太阳电池少数载流子寿命研究与测量
4.a few will live longer--,少数人寿命会长一些，
5.attainment of a life expectancy of 60 years as a minimum by the year 2000 2000年使预期寿命至少达到
6.The mobility and the lifetime of minority carriers in polysilicon films are two key parameters of current gain increment.多晶硅膜的少子迁移率和寿命是提高电流增益的两个关键参数.
7.Standard test methods for minority carrier lifetime in bulk germanium and silicon silicon by measurement of photoconductivity decayGB/T1553-1997硅和锗体内少数载流子寿命测定光电导衰减法
8.mean life of excited atom受激原子的平均寿命
9.Friction can be reduced and the life of the machine prolonged by lubrication.润滑能减少摩擦，延长机器寿命。
10.However this problem has been solved, partially with alloying. By adding quite small amount of tellurium to the lead, the life of the pipe can be doubled.但这一问题用合金的办法部分地解决了。在铅中加进少量的碲，管子的寿命可以延长一倍。
11.New supershortlived particles are called resonances.新超短寿命粒子叫做共振态粒子。
12.Direct Mass Measurement for Short-lived Neutron-rich Nuclides;短寿命丰中子原子核的直接质量测量
13.actual life有效寿命,实际寿命
14.lives are made short by up to two years because of poor air quality.因为空气质量恶劣，人的寿命减少了将近两年。
15.An Analysis of Mortality and Average Life of Several National Monorities in Guizhou Province贵州省少数民族人口死亡率及平均寿命分析
16.③ the loss of average expected life-span seemed to be less as the incidental age for pneumoconiosis getting older.③平均预期寿命损失随发病年龄增大而减少。
17.ALTREC (Automatic Life Testing and Recording of Electronic Components)自动化电子器件寿命测试与记录
18.His corporate's life will be as short as a rabbit's tail.他的公司的寿命是兔子尾巴长不了。

相关短句/例句

carrier lifetime少子寿命
1.Oxygen and carbon behavior and minority-carrier lifetimes in multicrystalline silicon(mc-Si) were investigated by means of FTIR and QSSPCD after three step annealing.对多晶硅片进行三步退火处理,用傅里叶红外光谱仪(FTIR)和准稳态光电导衰减法(QSSPCD)测硅片退火前后氧碳含量及少子寿命,并对单晶硅片做同样处理进行比较。
2.Through the investigation for variations of minor carrier lifetime before and after light irradiation and annealing and the correlation between light degradation and boron and oxygen concentrations, it was clarified that boron and interstitial oxygen were major components of defect center for light degradation of Bdoped cSi solar cells.通过光照及退火处理前后少子寿命变化的研究以及光衰减与硼和氧浓度关系的研究,表明引起掺硼晶硅太阳电池光照衰减的主要因素是硼和间隙氧的存在。
3)τ-the life time of minority carriersτ-少子寿命
4)minority carrier lifetime少数载流子寿命
1.The minority carrier lifetime ( τ ) in the base region of a solar cell is one of the most important parameters that affects the conversion efficiency of the device.太阳电池基区的少数载流子寿命是影响电池效率的重要因素之一。
2.A new method of microwave reflectance applied in measurement for the minority carrier lifetime in HgCdTe is introduced.介绍了用微波反射法测量HgCdTe中的少数载流子寿命 ,分析了其测量原理 ,并与接触式的光电导衰减法进行了对比。
3.Through measuring I-V character of solar cells, short circuit current and open circuit voltage and series resistant and shunt resistant could be gained, and then minority carrier lifetime and dark saturation current are calculated by the new method.本文通过对测试少数载流子寿命的各种方法进行分析后提出了一种新的测量成品太阳电池基区少数载流子寿命的方法,这种方法通过分析太阳电池的Ⅰ-Ⅴ特性得到基区少数载流子寿命与太阳电池开路电压、短路电流的关系。
5)minority carrier generation lifetime少子产生寿命
1.An improved technique of determining minority carrier generation lifetime in semiconductor from C-t transient curve of a MOS capacitor under linear voltage ramp bias was developed.提出了 MOS电容线性电压扫描法测量半导体少子产生寿命的新方法。
6)the effective minority carry lifetime有效少子寿命