三轴晶高分辨X射线衍射(TAXRD),TAXRD英语短句,例句大全

三轴晶高分辨X射线衍射(TAXRD),TAXRD
1)TAXRD三轴晶高分辨X射线衍射(TAXRD)
1.Two AlGaN thin films with two different growing structure were characterized by TAXRD.利用三轴晶高分辨X射线衍射(TAXRD)表征手段对2种生长结构下的AlGaN进行表征分析。
2)high-resolution triple-axis X-ray diffraction高分辨三轴晶X射线衍射
1.Synchrotron radiation double-crystal topography (SRDT) in combination with high-resolution triple-axis X-ray diffraction (HRTXD) is employed to characterize Si/SiGe/Si-SOI subjected to in-situ low-temperature annealing.运用同步辐射双晶貌相术结合高分辨三轴晶X射线衍射对经原位低温热处理的Si/SiGe/Si SOI异质结构进行研究,发现Si层(004)衍射峰两侧半高宽(FWHMs)处同步辐射双晶形貌像特征存在明显差异。
3)high-resolution multi-crystal multi-reflection X-ray diffraction(HRMCMRXD)高分辨率多重晶多重反射X射线衍射
4)triple-axis x-ray diffractionx射线三轴晶衍射
5)high-resolution X-ray diffraction高分辨X射线衍射
1.Combining Rutherford backscattering/channeling (RBS/C) and high-resolution X-ray diffraction (HXRD) measurements, we investigate the radiation damage in GaN films with various doses and angles of Mg~+_implantation.结合卢瑟福背散射/沟道(Rutherford backscattering/channeling,RBS/C)和高分辨X射线衍射(high-resolution X-ray diffraction,HXRD)的实验测量,研究了不同剂量和不同角度Mg+注入GaN所造成的辐射损伤。
2.Micropipes and low-angle boundaries in 6H-SiC (0001) wafer are determined by transmission polarized light microscopy, synchrotron X-ray topography and high-resolution X-ray diffraction method, respectively.利用透射偏光显微术、同步辐射X射线形貌术、高分辨X射线衍射方法对 6H SiC(0 0 0 1)晶片中的微管和小角度晶界等缺陷进行了研究。
3.In this thesis, high-resolution X-ray diffraction and transmission electron microscope were used to analyze the microstruction of GaN LED on sapphire substrate.利用高分辨X射线衍射对GaN基LED外延片的超晶格结构进行了测量,得出了超晶格的结构信息。

英文短句/例句

1.Structure Study of GaN/Al_2O_3 by High Resolution X-ray Diffraction;利用高分辨X射线衍射仪表征GaN/Al_2O_3薄膜结构特性
2.Characterization of Structure of GaN Films by High Resolution X-ray Diffraction Analysis利用高分辨X射线衍射仪表征GaN薄膜的结构特性
3.X-ray Diffractive analysis of Crystal Structure ?X-射线衍射晶体分析
4.x ray photoemission diffractionx射线光电发射衍射
5.Study on Molten Structure of Ni_3Al Alloy by High Temperature X-ray DiffractionNi_3Al合金熔体结构的高温X射线衍射分析
6.high resolution medical X-ray TV diagnosing system高分辨力医用X射线电视诊断系统
7.The Study of High-resolution X-ray Digital Radiography高分辨率X射线数字化成像技术研究
8.The Analysis of Nanostructured Co/Fe/Cu Granular Alloys by X-ray Diffraction;纳米Co/Fe/Cu合金的X射线衍射分析
9.Application of X-ray Diffraction Technology in Material AnalysisX射线衍射技术在材料分析中的应用
10.Stress Analysis of J75 Stainless Steel Aftrer Quenching by X-ray DiffractionJ75不锈钢淬火应力的X射线衍射分析
11.single crystal X-ray diffractometer单晶体x射线衍射仪
12.nondiffraction X-ray spectrometer非衍射x射线光谱仪
13.X-ray diffraction pattern computerX射线衍射图谱计算机
14.circular X-ray diffraction camera圆形X射线衍射照相机
15.energy dispersive X-ray diffractometer能量扩散X射线衍射仪
16.Applications of Polycrystal X-ray Diffraction多晶 X射线衍射应用
17.X-ray diffraction analysis of Pt film prepared by magnetron sputtering method磁控溅射Pt薄膜织构的X射线衍射分析
18.The Design of High-Resolution X-ray Imaging System Based on MCP;基于MCP的高分辨率X射线成像系统设计

相关短句/例句

high-resolution triple-axis X-ray diffraction高分辨三轴晶X射线衍射
1.Synchrotron radiation double-crystal topography (SRDT) in combination with high-resolution triple-axis X-ray diffraction (HRTXD) is employed to characterize Si/SiGe/Si-SOI subjected to in-situ low-temperature annealing.运用同步辐射双晶貌相术结合高分辨三轴晶X射线衍射对经原位低温热处理的Si/SiGe/Si SOI异质结构进行研究,发现Si层(004)衍射峰两侧半高宽(FWHMs)处同步辐射双晶形貌像特征存在明显差异。
3)high-resolution multi-crystal multi-reflection X-ray diffraction(HRMCMRXD)高分辨率多重晶多重反射X射线衍射
4)triple-axis x-ray diffractionx射线三轴晶衍射
5)high-resolution X-ray diffraction高分辨X射线衍射
1.Combining Rutherford backscattering/channeling (RBS/C) and high-resolution X-ray diffraction (HXRD) measurements, we investigate the radiation damage in GaN films with various doses and angles of Mg~+_implantation.结合卢瑟福背散射/沟道(Rutherford backscattering/channeling,RBS/C)和高分辨X射线衍射(high-resolution X-ray diffraction,HXRD)的实验测量,研究了不同剂量和不同角度Mg+注入GaN所造成的辐射损伤。
2.Micropipes and low-angle boundaries in 6H-SiC (0001) wafer are determined by transmission polarized light microscopy, synchrotron X-ray topography and high-resolution X-ray diffraction method, respectively.利用透射偏光显微术、同步辐射X射线形貌术、高分辨X射线衍射方法对 6H SiC(0 0 0 1)晶片中的微管和小角度晶界等缺陷进行了研究。
3.In this thesis, high-resolution X-ray diffraction and transmission electron microscope were used to analyze the microstruction of GaN LED on sapphire substrate.利用高分辨X射线衍射对GaN基LED外延片的超晶格结构进行了测量,得出了超晶格的结构信息。
6)HRXRD高分辨X射线衍射
1.have been gained by analyzing eptaxial STO films with a high resolution X-ray diffractometer(HRXRD+ TAXRD).本文应用高分辨X射线衍射(HRXRD+TAXRD)技术对外延生长的SrTiO3膜进行了分析,获得了有关该薄膜的晶体取向、衬底的结构特性以及弛豫态的点阵常数等信息,对今后改进SrTiO3系列样品生长工艺有重要的意义。
2.The effect of annealing time on the epitaxial strain in GaN films was detailedly studied by high-resolution X-ray diffraction(HRXRD).采用低压金属有机化学气相外延(LP-MOCVD)法生长Mg掺杂p型GaN薄膜,利用高分辨X射线衍射(HRXRD)技术研究不同退火时间对GaN薄膜中外延应变的影响。